Quantity: 1 available
1st ed. "All the major aspects of semiconductor device reliability receive coverage in this text." Pp. 13/205, figures and diagrams throughout, fep top corner clipped. Illustrated laminated boards. G+.
Title: Failure Mechanisms in Semiconductor Devices.
Publisher: Chichester: John Wiley & Sons, 1987.:
Item: 1.00 Item
Seller ID: 24172